This seminar is specially designed for Infotech students!
Today’s economy and even entire societies rest upon information technology. All servers, smartphones, and the billions of embedded devices depend on their underlying hardware. Only with careful design and thorough testing is this hardware reliable enough to enable today’s societies. Yet the demand for more capable chips is exploding while the manufacturing technology itself reaches new levels of complexity. Traditional design and test methods are insufficient for dealing with this unprecedented increase in demand and complexity. Thus, it is now more important than ever to develop and deploy intelligent methods for test and reliability. In this seminar, we explore recent breakthroughs in the areas of machine learning, artificial intelligence, data analytics, security, and many others. Such emerging techniques enable novel intelligent methods for chip design, test, diagnosis, and reliability to reduce cost and time to market. However, to benefit from those breakthroughs, expertise in that area and domain knowledge of chip testing has to be combined. This seminar takes a wider look across multiple areas of research to enable tomorrow’s designers and engineers to combine expertise with domain knowledge. Only then will they be in a position to create reliable technology enabling tomorrow’s society.
This seminar is offered by the Gradudate School Intelligent Methods for Test and Reliability.
First contact meeting:
Monday, April 11, 1pm-2pm (tentative)